The purpose of the project is to simply identify and test the condition of digital IC if it is good or defective. An IC tester can be applied to any type of digital ICs. There are some provisions that ...

San Diego – An IC test consortium backed by Intel Corp. and Advantest Corp. released its first hardware and software specifications last week to enable an “open architecture” for automatic test ...

The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...

In this paper, the authors describe the implementation of testing of CMOS (Complementary Metal-Oxide-Semiconductor) digital integrated circuits for both functional and delay fault testing using ...

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how ...